The Beam Diagnostic Instrumentation System 5000 provides potential users with a line of diagnostics including both mechanics and associated electronics

System 5100

Description

The system is especially designed for providing data on the intensity, profile and position of ion or electron beams. It can be used with all forms of particle accelerators such as mass spectrometers, isotope separators, and V.d. Graaff accelerators.

The ”heart” of the system is the probe unit, which can be supplied with sensor probes of different shapes to suit different applications. The probe sweeps through the beam and intercepts part of it; the current, absorbed by the probe, is carried to an oscilloscope (optional), where the ”X” deflection is controlled by the electronic driver unit. This process gives a picture on the oscilloscope of the intercepted current as a function of the probe’s movement through the beam, furnishing information on the intensity, profile and position of the beam

Lars Anthon

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Lars Anthon

+45 72202340

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